Testability has become a common theme in the world of interconnects. In addition to the design for manufacturability review we provide at the pre-engineering stage, we have the ability to provide analysis for testability. Our DFT (Design for Testability) partner utilizes the same database files to determine accessibility for the ICT (In-Circuit Test) probes to ensure the highest level of test coverage possible.

In addition to testability analysis, our alliance manufactures ICT test fixtures for Teradyne, Genrad, and HP test systems.